Differential-reflectance spectroscopy and reflectance-anisotropy spectroscopy on semiconductor surfaces

被引：49

作者：

Chiaradia, P ^{[1
]}

Del Sole, R

机构：

[1] Univ Roma Tor Vergata, Dipartimento Fis, Rome, Italy

[2] Univ Roma Tor Vergata, INFM, Rome, Italy

来源：

SURFACE REVIEW AND LETTERS | 1999年 / 6卷 / 3-4期

关键词：

D O I：

10.1142/S0218625X99000482

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The development and the state of the art of surface methods based on the reflection of light are briefly reviewed. A short account is given of the main experimental and theoretical results obtained on semiconductor surfaces over about three decades.

引用

页码：517 / 528

页数：12

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