Damage depth-profiling of Au+ and O+-irradiated amorphous PEEK by monoenergetic positron beams

被引：13

作者：

Hirata, K

Kobayashi, Y

Hishita, S

Ujihira, Y

机构：

[1] NATL INST RES INORGAN MAT,TSUKUBA,IBARAKI 305,JAPAN

[2] UNIV TOKYO,ADV SCI & TECHNOL RES CTR,MEGURO KU,TOKYO 153,JAPAN

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1997年 / 64卷 / 05期

关键词：

D O I：

10.1007/s003390050507

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Amorphous poly(aryl-ether-ether ketone) (PEEK) irradiated with 2 MeV Au+ and O+ ions was exposed to positron beams to measure the positron annihilation Doppler broadening as a function of the positron energy. As in the previous case of O+-irradiated semicrystalline PEEK, the annihilation lines recorded at relatively low positron energies became broader with increasing irradiation dose. The thickness of the damaged layer estimated from the positron data was compared with the mean depth of the implanted ions calculated by the TRIM code. For the Au+-irradiated samples, some discrepancy was observed between the two quantities.

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页码：491 / 495

页数：5

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