Growth and Raman scattering characterization of Cu2ZnSnS4 thin films

被引：481

作者：

Fernandes, P. A. ^{[1
,2
]}

Salome, P. M. P. ^{[1
]}

da Cunha, A. F. ^{[1
]}

机构：

[1] Univ Aveiro, Dept Fis, P-3810193 Aveiro, Portugal

[2] Inst Politecn Porto, Inst Super Engn Porto, Dept Fis, P-4200072 Oporto, Portugal

来源：

THIN SOLID FILMS | 2009年 / 517卷 / 07期

关键词：

Cu2ZnSnS4; CZTS; Sputtering; Sulfurization; Thin film; Solar cell; Raman scattering; SOLAR-CELLS; FABRICATION; INDIUM;

D O I：

10.1016/j.tsf.2008.11.031

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the present work we report the results of the growth, morphological and structural characterization of Cu2ZnSnS4 (CZTS) thin films prepared by sulfurization of DC magnetron sputtered Cu/Zn/Sn precursor layers. The adjustment of the thicknesses and the properties of the precursors were used to control the final composition of the films. Its properties were studied by SEM/EDS, XRD and Raman scattering. The influence of the sulfurization temperature on the morphology. composition and structure of the films has been studied. With the presented method we have been able to prepare CZTS thin films with the kesterite structure. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：2519 / 2523

页数：5

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