Network transformation processes during oxidation of silicon

被引:4
作者
Pasquarello, A [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Inst Romand Rech Numer Phys Mat, PPH Ecublens, CH-1015 Lausanne, Switzerland
关键词
D O I
10.1016/S0167-9317(99)00345-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using density functional calculations in the generalized gradient approximation, the energetics of competing atomic processes occuring during the oxidation of silicon are evaluated. Simple molecular systems are used to model the breaking of Si-Si and Si-O bonds in the oxide. These calculations suggest that the breaking of Si-Si bonds and the formation of threefold coordinated O atoms are the most favourable transformation pathways of the bonding network of the oxide, in accord with the atomic processes observed during a recent first-principle molecular dynamics simulation.
引用
收藏
页码:89 / 94
页数:6
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