Insulator-metal transition of fluid molecular hydrogen

被引:54
作者
Ross, M
机构
[1] Lawrence Livermore National Laboratory, Livermore
关键词
D O I
10.1103/PhysRevB.54.R9589
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Dynamically compressed fluid hydrogen shows evidence for metallization at the relatively low pressure of 140 GPa (1.4 Mbar) while experiments on solid hydrogen made in a diamond-anvil cell have failed to detect any evidence for gap closure up to a pressure of 230 GPa (2.3 Mbar). Two possible mechanisms for metalliclike resistivity are put forward. The first is that as a consequence of the large thermal disorder in the fluid (kT similar to 0.2-0.3 eV) short-range molecular interactions lead to band tailing that extends the band edge into the gap, resulting in closure at a lower pressure than in the solid. The second mechanism argues that molecular dissociation creates H atoms that behave similar to n-type donors in a heavily doped semiconductor and undergo a nonmetal-metal Mott-type transition.
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收藏
页码:R9589 / R9591
页数:3
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