Characterization of phase purity in organic semiconductors by lattice-phonon confocal Raman mapping: Application to pentacene

被引：68

作者：

Brillante, A

Bilotti, I

Della Valle, RG

Venuti, E

Masino, M

Girlando, A

机构：

[1] Univ Bologna, Dipartimento Chim Fis & Inorgan, I-40136 Bologna, Italy

[2] Univ Bologna, INSTM, UdR Bologna, I-40136 Bologna, Italy

[3] Univ Parma, Dipartimento Chim, GIAF, I-43100 Parma, Italy

[4] Univ Parma, INSTM, UdR Parma, I-43100 Parma, Italy

来源：

ADVANCED MATERIALS | 2005年 / 17卷 / 21期

关键词：

D O I：

10.1002/adma.200501350

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Lattice-phonon confocal Raman mapping is a powerful technique to probe the crystal structure of polymorphs of organic semiconductors. This technique is fast, reliable, and capable of monitoring physical modifications and phase inhomogeneities in crystal domains at the micrometer scale. Applying the technique to pentacene crystals (see Figure) shows that phase inhomogeneities are not confined to the crystal surface, but penetrate into the crystal.

引用

页码：2549 / +

页数：6

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