Passivation of GaAs using gallium-gadolinium oxides

被引:22
作者
Kwo, J [1 ]
Murphy, DW [1 ]
Hong, M [1 ]
Mannaerts, JP [1 ]
Opila, RL [1 ]
Masaitis, RL [1 ]
Sergent, AM [1 ]
机构
[1] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1999年 / 17卷 / 03期
关键词
D O I
10.1116/1.590743
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The role of Gd2O3 is investigated in our previously discovered oxide films of Ga2O3(Gd2O3) for GaAs surface passivation. Based on the systematic dependence of the dielectric properties of (Ga2O3)(1-x)(Gd2O3)(x) on the Gd (x) content, we showed that pure gallium oxide does not effectively passivate GaAs, and Gd2O3 is a necessary component to stabilize the gallium oxide in the 3(+) fully oxidized state due to the electropositive nature of Gd+3. This gives rise to electrically insulting films of low leakage current and high electrical breakdown strength. (C) 1999 American Vacuum Society. [S0734-211X(99)02803-6].
引用
收藏
页码:1294 / 1296
页数:3
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