Atomic force microscopy of in situ deformed nickel thin films

被引：55

作者：

Coupeau, C ^{[1
]}

Naud, JF ^{[1
]}

Cleymand, F ^{[1
]}

Goudeau, P ^{[1
]}

Grilhé, J ^{[1
]}

机构：

[1] Univ Poitiers, Met Phys Lab, F-86960 Futuroscope, France

来源：

THIN SOLID FILMS | 1999年 / 353卷 / 1-2期

关键词：

buckling; atomic force microscopy; surface morphology;

D O I：

10.1016/S0040-6090(99)00369-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The mechanical behaviour of thin metal films on substrate under stress and particularly the analysis of the first stage of buckling have been characterized. Nickel/polycarbonate samples have been studied using a specific atomic force microscopy which allows the observation in situ of the sample surface during deformation. Straight wrinkle-like shapes are induced in the Ni thin film above a critical stress perpendicular to the compression axis. Undulations of very low amplitude appear also on these debonded regions. The dependence on stress of the shape of the straight wrinkles and of the undulations is discussed. It is shown that theses experiments may be thought of as an alternative method to estimate the localised internal stress sigma(i) and the adhesion energy Gamma between the film and substrate. (C) 1999 Elsevier Science S.A. All rights reserved.

引用

页码：194 / 200

页数：7

共 23 条

[1]

[Anonymous], PHYS REV LETT

[2] ONE DIMENSIONAL MODELING OF FAILURE IN LAMINATED PLATES BY DELAMINATION BUCKLING [J].