Statistical analysis of in-situ slip lines by atomic force microscopy observations

被引：13

作者：

Coupeau, C

Girard, JC

Grilhe, J

Lepinoux, J

机构：

[1] Laboratoire de Métallurgie Physique, Université de Poitiers, UMR 6630 du CNRS, Futuroscope Cedex, 86960, Batiment SP2MI, Bld 3, Téléport 2

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1997年 / 76卷 / 06期

关键词：

D O I：

10.1080/01418619708214219

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Atomic force microscopy images have been performed in situ during deformation of MC2 Nickel-based alloy phase gamma and LiF single crystals at room temperature. The appearance of slip lines was continuously observed. We propose methods to determine the statistic average step height and terrace width of this pattern. For the two crystals, hierarchical organization of slip lines is deduced.

引用

页码：1139 / 1152

页数：14

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