共 4 条
Measurement of identified π0 and inclusive photon second-harmonic parameter v2 and implications for direct photon production in √sNN=200 GeVAu+Au -: Reply -: art. no. 039704
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作者:

Paillet, M
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LCVN, Montpellier, France LCVN, Montpellier, France

Poncharal, P
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机构:
LCVN, Montpellier, France LCVN, Montpellier, France

Zahab, A
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机构:
LCVN, Montpellier, France LCVN, Montpellier, France
机构:
[1] LCVN, Montpellier, France
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D O I:
10.1103/PhysRevLett.96.039704
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
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相关论文
共 4 条
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Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy
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Paillet, M
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机构:
Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France

Poncharal, P
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h-index: 0
机构:
Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France

Zahab, A
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France Univ Montpellier 2, CNRS, UMR 5581, Dynam Phases Condensees Grp, F-34095 Montpellier, France
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Radosavljevic, M
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机构: Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA

Freitag, M
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机构: Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA

Thadani, KV
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机构: Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA

Johnson, AT
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机构:
Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA Univ Penn, Dept Phys & Astron, Philadelphia, PA 19104 USA
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Zdrojek, M
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

Mélin, T
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

Boyaval, C
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

Stiévenard, D
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

Jouault, B
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

Wozniak, M
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

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Gebicki, W
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France

Adamowicz, L
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机构: CNRS, UMR 8520, Inst Electron & Microelect & Nanotechnol, F-59652 Villeneuve Dascq, France
[4]
Comment on "Electrostatics of individual single-walled carbon nanotubes investigated by electrostatic force microscopy" -: art. no. 039703
[J].
Zdrojek, M
;
Mélin, T
;
Diesinger, H
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Stiévenard, D
;
Gebicki, W
;
Adamowicz, L
.
PHYSICAL REVIEW LETTERS,
2006, 96 (03)

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Mélin, T
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机构: CNRS, UMR 8520, Inst Elect Microelect & Nanotechnol, Dept ISEN, F-59652 Villeneuve Dascq, France

Diesinger, H
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机构: CNRS, UMR 8520, Inst Elect Microelect & Nanotechnol, Dept ISEN, F-59652 Villeneuve Dascq, France

Stiévenard, D
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机构: CNRS, UMR 8520, Inst Elect Microelect & Nanotechnol, Dept ISEN, F-59652 Villeneuve Dascq, France

Gebicki, W
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机构: CNRS, UMR 8520, Inst Elect Microelect & Nanotechnol, Dept ISEN, F-59652 Villeneuve Dascq, France

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