A comparison of the theory of moisture diffusion in plastic encapsulated microelectronics with moisture sensor chip and weight-gain measurements

被引:25
作者
Ardebili, H
Hillman, C
Natishan, MAE
McCluskey, P
Pecht, MG
Peterson, D
机构
[1] Univ Maryland, CALCE Elect Prod & Syst Ctr, College Pk, MD 20742 USA
[2] Phoenix Engn Assoc Inc, Davidson, MD 21035 USA
[3] Sandia Natl Labs, Albuquerque, NM USA
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2002年 / 25卷 / 01期
关键词
capacitance change; Fickian diffusion modeling; hydrogen bonding; moisture diffusion; moisture sensor; plastic encapsulated microelectronics;
D O I
10.1109/6144.991185
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, the issues pertaining to moisture diffusion in PEMs are explored and discussed. The existing models of moisture diffusion in plastic molding compounds and PEMs are reviewed. Results, modeling and analysis of moisture sorption experiments performed in this study are presented. The moisture sorption experiments were conducted on a set of PEM samples with a common type of encapsulant material to 1) characterize sorption behavior; 2) compare weight gain measurement to the measurement of moisture concentration using a moisture sensor device at the die surface; 3) assess the moisture sensor measurement method. In the case of PEM samples tested in this study, simple Fickian diffusion was shown to agree closely with the experimental results. In one case, a relatively small anomaly from Fickian diffusion was observed and was attributed to swelling and relaxation phenomena at later stages of moisture sorption in the molding compound. The calibration constants determined for the sensors in this study were found to be significantly different from those collected by the manufacturer prior to the encapsulation or the devices. This problem is believed to be degradation in sensitivity of the moisture sensor due to exposure to high temperatures and storage conditions.
引用
收藏
页码:132 / 139
页数:8
相关论文
共 22 条
[11]   A fracture mechanics analysis of the effects of material properties and geometries of components on various types of package cracks [J].
Lee, H ;
Earmme, YY .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1996, 19 (02) :168-178
[12]  
LIN R, 1988, P INT REL PHYS S, P83
[13]   EFFECT OF MOISTURE ON THE PHYSICAL AND MECHANICAL INTEGRITY OF EPOXIES [J].
MORGAN, RJ ;
ONEAL, JE ;
FANTER, DL .
JOURNAL OF MATERIALS SCIENCE, 1980, 15 (03) :751-764
[14]  
PETERSON DW, 1993, PROPOSAL
[15]  
Rauhut H. W., 1996, International Journal of Microcircuits and Electronic Packaging, V19, P330
[16]  
SHOOK RL, 1992, P INT REL PHYS S, P157
[17]  
Soane DS, 1989, POLYM MICROELECTRONI
[18]   Moisture migration and cracking in plastic quad flat packages (PQFPs) [J].
Taylor, SA ;
Chen, K ;
Mahajan, R .
JOURNAL OF ELECTRONIC PACKAGING, 1997, 119 (02) :85-88
[19]  
TENCER M, 1994, P IEEE 44 EL COMP TE
[20]  
Vanlandingham MR, 1999, J APPL POLYM SCI, V71, P787, DOI 10.1002/(SICI)1097-4628(19990131)71:5<787::AID-APP12>3.0.CO