Direct evidence for ferroelectric polar distortion in ultrathin lead titanate perovskite films

被引：70

作者：

Despont, L ^{[1
]}

Koitzsch, C

Clerc, F

Garnier, MG

Aebi, P

Lichtensteiger, C

Triscone, JM

Garcia de Abajo, FJ

Bousquet, E

Ghosez, P

机构：

[1] Univ Neuchatel, Inst Phys, CH-2000 Neuchatel, Switzerland

[2] Univ Geneva, DPMC, CH-1211 Geneva 4, Switzerland

[3] CSIC, UPV, EHU, Ctr Mixto, San Sebastian, Spain

[4] Univ Liege, Dept Phys, B-4000 Sart Tilman Par Liege, Belgium

来源：

PHYSICAL REVIEW B | 2006年 / 73卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.73.094110

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray photoelectron diffraction is used to directly probe the intracell polar atomic distortion and tetragonality associated with ferroelectricity in ultrathin epitaxial PbTiO3 films. Our measurements, combined with ab initio calculations, unambiguously demonstrate noncentrosymmetry in films a few unit cells thick, imply that films as thin as three unit cells still preserve a ferroelectric polar distortion, and also show that there is no thick paraelectric dead layer at the surface.

引用

页数：6

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