Structural characterization of the low-temperature phase in Sr-Bi-Ta-O films

被引：21

作者：

Lee, JS

Kwon, HJ

Jeong, YW

Kim, HH

Hyun, SJ

Noh, TW

机构：

[1] LG Corp Inst Technol, Seoul 137724, South Korea

[2] Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea

来源：

APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 18期

关键词：

D O I：

10.1063/1.123938

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The crystal structure and microstructural evolution of Sr-Bi-Ta-O films grown on LaAlO3 substrates were investigated using x-ray diffraction and cross-sectional transmission electron microscopy. It was found that the epitaxial low-temperature phase found in the as-deposited and 650 degrees C heat-treated films has a fluorite structure (CaF2-type structure) with a face-centered-cubic symmetry. From the electron diffraction patterns for the fluorite phase, {1/2 1/2 1/2} and {100}-type superlattice spots were observed. The epitaxial fluorite phase was gradually encroached upon by polycrystalline layered perovskite SrBi2Ta2O9 grains during heat treatment at 750 degrees C. (C) 1999 American Institute of Physics. [S0003-6951(99)05018-4].

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页码：2690 / 2692

页数：3

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