Conductive AFM and chemical analysis of highly conductive paths in DC degraded PZT with Ag/Pd electrodes

被引:9
作者
Andrejs, L. [1 ]
Ossmer, H. [1 ]
Friedbacher, G. [2 ]
Bernardi, J. [3 ]
Limbeck, A. [2 ]
Fleig, J. [1 ]
机构
[1] Vienna Univ Technol, Inst Chem Technol & Analyt, Christian Doppler Lab Ferro Mat, A-1060 Vienna, Austria
[2] Vienna Univ Technol, Inst Chem Technol & Analyt, A-1060 Vienna, Austria
[3] Vienna Univ Technol, Univ Serv Ctr Transmiss Electron Microscopy, A-1060 Vienna, Austria
关键词
Degradation; Silver filaments; Grain boundaries; C-AFM; PZT; REAL-TIME OBSERVATION; PEROVSKITE-TYPE TITANATES; DYNAMIC GROWTH/DISSOLUTION; ELECTROCHEMICAL GROWTH; ELECTRICAL DEGRADATION; RESISTANCE DEGRADATION; CERAMIC STACKS; FILAMENTS; MODEL;
D O I
10.1016/j.ssi.2013.04.020
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
DC degraded PZT layers were studied by means of energy dispersive X-ray spectroscopy (EDX), laser ablation-inductively coupled plasma-mass spectrometry (LA-ICP-MS), transmission electron microscopy (TEM), scanning electron microscopy (SEM) and conductive atomic force microscopy (C-AFM). It is shown that mainly silver originating from the anode is massively redistributed on/in the PZT during voltage load. Highly conductive silver paths/filaments are strongly localized to grain boundaries in the bulk of the PZT layers and unambiguously identified as responsible for metal-like connection between anode and cathode. Formation of these paths starts close to the anode. This indicates the existence of a novel mode of resistance degradation without impact of humidity. A corresponding mechanism based on voltage induced oversaturation of PZT grains with silver and non-conventional electrochemical formation of anodic silver filaments is suggested. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:5 / 16
页数:12
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