Morphology and conductivity modification of poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) films induced by conductive atomic force microscopy measurements

被引：30

作者：

Dang, Xuan-Dung ^{[1
]}

Dante, Mark ^{[1
]}

Nguyen, Thuc-Quyen ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Dept Chem & Biochem, Ctr Polymers & Organ Solids, Santa Barbara, CA 93106 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 24期

关键词：

atomic force microscopy; electrical conductivity; organic semiconductors; polymer structure; semiconductor thin films;

D O I：

10.1063/1.3049599

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Morphology and conductivity modifications in poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) films induced by conductive atomic force microscopy probe are investigated. At an applied bias of positive or negative 10 V, raised features of 12.8 +/- 1.8 nm in height are generated and the local film conductivity is reduced. The feature height formation is irreversible and dependent on both applied bias and tip velocity. The mechanism by which these features are generated is proposed to be mass transport of PSS- to the surface under the atomic force microscope tip. This finding may open up the possibility of patterning PEDOT:PSS films, and thereby organic optoelectronic devices.

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页数：3

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