Semiconductive polymer blends: Correlating structure with transport properties at the nanoscale

被引：148

作者：

Ionescu-Zanetti, C

Mechler, A

Carter, SA

Lal, R ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Neurosci Res Inst, Santa Barbara, CA 93106 USA

[2] Univ Calif Santa Cruz, Dept Phys, Santa Cruz, CA 95064 USA

来源：

ADVANCED MATERIALS | 2004年 / 16卷 / 05期

关键词：

D O I：

10.1002/adma.200305747

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Multimodal atomic force microscopy (AFM) was used to map charge transfer properties in correlation to the molecular superstructure of poly(ethyldioxythiophene)-poly(styrenesulfonic acid) (see Figure). The lamellar domains of the polymer blend are indicated by phase shifts. Efficient charge injection occurs when lamellar edges of the superstructure are exposed to a conductive AFM probe. Efficiency of charge injection at polymer-electrode interfaces could be enhanced by controlling lamellar orientation.

引用

页码：385 / +

页数：6

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