Hollow-core screw dislocations in 6H-SiC single crystals: A test of Frank's theory

被引:39
作者
Si, WM [1 ]
Dudley, M [1 ]
Glass, R [1 ]
Tsvetkov, V [1 ]
Carter, C [1 ]
机构
[1] CREE RES INC,DURHAM,NC 27713
关键词
6H-SiC; hollow-core screw dislocations; micropipes;
D O I
10.1007/s11664-997-0138-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Hollow-core screw dislocations, also known as ''micropipes'', along the [0001] axis in 6H-SiC single crystals, have been studied by synchrotron white beam x-ray topography (SWBXT), scanning electron microscopy (SEM), and Nomarski optical microscopy (NOM). Using SWBXT, the magnitude of the Burgers vector of screw dislocations has been determined by measuring the following four parameters: (1) the diameter of dislocation images in back-reflection topographs; (2) the width of bimodal dislocation images in transmission topographs; (3) the magnitude of the tilt of lattice planes on both sides of dislocation core in projection topographs; and (4) the magnitude of the tilt of lattice planes in section topographs. The four methods show good agreement. SEM results reveal that micropipes emerge as holes on the as-grown surface, with their diameters ranging from about 0.1 to a few micrometers. Correlation between topographic images and SEM micrographs shows that micropipes are hollow-core screw dislocations with Burgers vector magnitudes from 2c to 7c (c is the lattice parameter along the [0001] axis). There is no empirical evidence that 1c dislocations have hollow cores. The Burgers vector magnitude of screw dislocations, b, and the diameter of associated micropipes, D, were fitted to Frank's prediction for hollow-core screw dislocations: D = mu b(2)/4 pi(2) gamma, where mu is shear modulus, and gamma is specific surface energy. Statistical analysis of the relationship between D and b(2) shows that it is approximately linear, and the constant gamma/mu ranges from 1.1 x 10(-3) to 1.6 x 10(-3) nm.
引用
收藏
页码:128 / 133
页数:6
相关论文
共 15 条
[1]   WHITE-BEAM SYNCHROTRON TOPOGRAPHIC STUDIES OF DEFECTS IN 6H-SIC SINGLE-CRYSTALS [J].
DUDLEY, M ;
WANG, SP ;
HUANG, W ;
CARTER, CH ;
TSVETKOV, VF ;
FAZI, C .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (4A) :A63-A68
[2]   CAPILLARY EQUILIBRIA OF DISLOCATED CRYSTALS [J].
FRANK, FC .
ACTA CRYSTALLOGRAPHICA, 1951, 4 (06) :497-501
[3]   HOLLOW SCREW DISLOCATION CORES IN SILICON CARBIDE [J].
GOLIGHTLY, JP .
ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1969, 130 (4-6) :310-+
[4]  
KIRSCHSTEIN G, 1984, GMELIN HDB INORGAN B, V2
[5]   INFLUENCE OF ELASTIC-ANISOTROPY ON X-RAY TOPOGRAPHIC IMAGE WIDTH OF PURE SCREW DISLOCATIONS [J].
KLAPPER, H .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1976, 9 (AUG1) :310-317
[6]   COMPARISON OF ATOMIC FORCE MICROSCOPY AND NANOSCALE OPTICAL MICROSCOPY FOR MEASURING STEP HEIGHTS [J].
KOMATSU, H ;
MIYASHITA, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (3B) :1478-1479
[7]   AN OPTICAL AND X-RAY TOPOGRAPHIC STUDY OF GIANT SCREW DISLOCATIONS IN SILICON-CARBIDE [J].
KRISHNA, P ;
JIANG, SS ;
LANG, AR .
JOURNAL OF CRYSTAL GROWTH, 1985, 71 (01) :41-56
[8]   GIANT SCREW DISLOCATIONS IN ZNS POLYTYPE CRYSTALS [J].
MARDIX, S ;
LANG, AR ;
BLECH, I .
PHILOSOPHICAL MAGAZINE, 1971, 24 (189) :683-&
[9]  
MILTAT J, 1980, CHARACTERIZATION CRY, P408
[10]   WIDTHS OF DISLOCATION IMAGES IN X-RAY TOPOGRAPHY UNDER LOW-ABSORPTION CONDITIONS [J].
MILTAT, JEA ;
BOWEN, DK .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (DEC1) :657-669