Extraction of highly charged ions from the electron beam ion trap at LBNL for applications in surface analysis and materials science

被引：25

作者：

Schenkel, T ^{[1
]}

Persaud, A

Kraemer, A

McDonald, JW

Holder, JP

Hamza, AV

Schneider, DH

机构：

[1] EO Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA

[2] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2002年 / 73卷 / 02期

关键词：

D O I：

10.1063/1.1429775

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe results from highly charged ion extraction experiments at the Electron Beam Ion Trap (EBIT) facility which is now operated at Lawrence Berkeley National Laboratory after transfer from Lawrence Livermore National Laboratory. Requirements on ion source performance for the application of highly charged ions (e.g., Xe44+) in surface analysis and materials science are discussed. (C) 2002 American Institute of Physics.

引用

页码：663 / 666

页数：4

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