Determining the relative permittivity and thickness of a lossless dielectric overlayer on a metal film using optically excited surface plasmon polaritons

被引:21
作者
Phelps, JM
Taylor, DM
机构
[1] Inst. Molec. and Biomol. Electronics, University of Wales, Bangor, Gwynedd LL57 1UT, Dean Street
关键词
D O I
10.1088/0022-3727/29/4/023
中图分类号
O59 [应用物理学];
学科分类号
摘要
Numerical simulations based on the exact Fresnel equations are used to show that it is possible to determine uniquely the relative permittivity and thickness of a thin lossless dielectric film adsorbed on a gold or silver layer. The calculations, which include the effects of up to 1% random noise on the experimental data, show clearly that there is no degeneracy in the solutions of the Fresnel equations even for films as thin as 2 nm. It is shown that gold is preferable to silver as a substrate when the overlayer properties need to be determined accurately. It is further shown that, if the overlayer is bounded by water rather than air,then the experimental constraints would preclude the use of silver as a substrate but measurements would still be possible with gold.
引用
收藏
页码:1080 / 1087
页数:8
相关论文
共 33 条
[1]   SURFACE ELECTROMAGNETIC-WAVES ELLIPSOMETRY [J].
ABELES, F .
SURFACE SCIENCE, 1976, 56 (01) :237-251
[2]   THIN LANGMUIR-BLODGETT-FILMS STUDIED USING SURFACE PLASMON-POLARITONS [J].
BARNES, WL ;
SAMBLES, JR .
SURFACE SCIENCE, 1987, 183 (1-2) :189-200
[3]   MONOLAYER AND MULTILAYER FILM CHARACTERIZATION USING SURFACE-PLASMON RESONANCE [J].
COOKE, SJ ;
ROBERTS, GG .
THIN SOLID FILMS, 1992, 210 (1-2) :685-688
[4]   RESOLVING THE APPARENT AMBIGUITY IN DETERMINING THE RELATIVE PERMITTIVITY AND THICKNESS OF A METAL-FILM USING OPTICAL-EXCITATION OF SURFACE PLASMON-POLARITONS [J].
COWEN, S ;
SAMBLES, JR .
OPTICS COMMUNICATIONS, 1990, 79 (06) :427-430
[5]   DETERMINATION OF DIELECTRIC PERMITTIVITY AND THICKNESS OF A METAL LAYER FROM A SURFACE-PLASMON RESONANCE EXPERIMENT [J].
DEBRUIJN, HE ;
KOOYMAN, RPH ;
GREVE, J .
APPLIED OPTICS, 1990, 29 (13) :1974-1978
[6]   DETERMINATION OF THICKNESS AND DIELECTRIC-CONSTANT OF THIN TRANSPARENT DIELECTRIC LAYERS USING SURFACE-PLASMON RESONANCE [J].
DEBRUIJN, HE ;
ALTENBURG, BSF ;
KOOYMAN, RPH ;
GREVE, J .
OPTICS COMMUNICATIONS, 1991, 82 (5-6) :425-432
[7]   THIN-FILM COATINGS - ALGORITHMS FOR THE DETERMINATION OF REFLECTANCE AND TRANSMITTANCE, AND THEIR DERIVATIVES [J].
DUPOISOT, H ;
MORIZET, J .
APPLIED OPTICS, 1979, 18 (15) :2701-2704
[8]  
GORDON JG, 1977, OPT COMMUN, V22, P374, DOI 10.1016/S0030-4018(97)90032-8
[9]  
GRACE ACW, 1989, THESIS U WALES BANGO
[10]   OBSERVATION OF AN INDEX-OF-REFRACTION-INDUCED CHANGE IN THE DRUDE PARAMETERS OF AG FILMS [J].
GUGGER, H ;
JURICH, M ;
SWALEN, JD ;
SIEVERS, AJ .
PHYSICAL REVIEW B, 1984, 30 (08) :4189-4195