X-ray scattering and absorption studies of MnAs/GaAs heterostructures

被引:15
作者
Huang, S
Ming, ZH
Soo, YL
Kao, YH
Tanaka, M
Munekata, H
机构
[1] UNIV TOKYO,DEPT ELECTR ENGN,TOKYO 113,JAPAN
[2] JAPAN RES & DEV CORP,PRESTO,TOKYO,JAPAN
[3] TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,YOKOHAMA,KANAGAWA 227,JAPAN
关键词
D O I
10.1063/1.360981
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ferromagnetic MnAs thin films grown on GaAs (001) substrates by molecular-beam epitaxy have been studied by the methods of grazing incidence x-ray scattering, x-ray diffraction, and extended x-ray-absorption fine structure. Microstructures in two films prepared with different first-layer growth conditions (template effects) are compared in terms of the interfacial roughness in the layer structure, lattice constants, epilayer thickness, local environment surrounding the Mn atoms, coordination number, and local disorder. Our results indicate that the template effects can cause significant differences in the local structures and crystallinity of the MnAs epitaxial layers. (C) 1996 American Institute of Physics.
引用
收藏
页码:1435 / 1440
页数:6
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