16GHz bandwidth MSM photodetector and 45/85GHz f(T)/f(max) HEMT prepared on an identical InGaAs/InP layer structure

被引:9
作者
Horstmann, M
Schimpf, K
Marso, M
Fox, A
Kordos, P
机构
[1] Inst. of Thin Film and Ion Technol., Research Centre Jülch
关键词
metal-semiconductor-metal structures; photodetectors; gallium indium arsenide;
D O I
10.1049/el:19960454
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An MSM photodetector and a HEMT prepared on an identical InGaAs/InP laver structure are demonstrated for the first time. A 150nm undoped InGaAs layer is inserted above the 2DEG to enhance the photodetector responsivity, and a bandwidth of 16GHz is achieved. On the same wafer. processed HEMTs show optimal high frequency performance with an f(T) of 45GHz and an f(max) of 85GHz. This procedure could be suitable for the preparation of monolithically integrated photoreceivers with high performance and low cost.
引用
收藏
页码:763 / 764
页数:2
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