Growth of praseodymium oxide and praseodymium silicate thin films by liquid injection MOCVD

被引:22
作者
Aspinall, HC
Gaskell, J
Williams, PA
Jones, AC [1 ]
Chalker, PR
Marshall, PA
Smith, LM
Critchlow, GW
机构
[1] Univ Liverpool, Dept Chem, Liverpool L69 3ZD, Merseyside, England
[2] Univ Liverpool, Dept Mat Sci & Engn, Liverpool L69 3BX, Merseyside, England
[3] Epichem Oxides & Nitrides, Wirral CH62 3QF, Merseyside, England
[4] Univ Loughborough, Inst Surface Sci & Technol, Loughborough LE11 3TU, Leics, England
关键词
alkoxide ligand; liquid injection MOCVD; praseodymium oxide; praseodymium silicate; silylamide ligand;
D O I
10.1002/cvde.200306282
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Thin films of praseodymium oxide have been deposited by liquid injection MOCVD using the volatile praseodymium alkoxide, [Pr(mmp)(3)] (mmp = 1-methoxy-2-methyl-2-propanolate, OCMe2CH2OMe). The films were grown over a wide range of substrate temperatures (250-600 degreesC) and were found to consist predominantly of the Pr6O11 phase. Praseodymium silicate films containing similar to16-22 at.-% Si were deposited over the temperature range 350-550 degreesC using [Pr{N(SiMe3)(2)}(3)] in the absence of any additional Si source.
引用
收藏
页码:83 / 89
页数:7
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