In situ TEM nanoindentation of nanoparticles

被引:62
作者
Carlton, C. E. [2 ]
Ferreira, P. J. [1 ]
机构
[1] Univ Texas Austin, Mat Sci & Engn Program, Austin, TX 78712 USA
[2] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
关键词
In situ TEM; Nanoindentation; Nanoparticles; Deformation; Dislocations; SILICON NANOSPHERES; PLASTICITY; DEFORMATION; SINGLE;
D O I
10.1016/j.micron.2012.03.002
中图分类号
TH742 [显微镜];
学科分类号
080401 [精密仪器及机械];
摘要
The deformation behavior of nanoparticles continues to be an exciting area for materials research. Typically, nanoparticles show a conspicuous lack of dislocations, even after significant deformation. Therefore, it has been suggested that dislocations cannot exist or/do not play a role on the deformation of nanoparticles. In situ TEM nanoindentation is a critical tool for addressing this issue because it allows for the deformation to be monitored in real time. In this article, we discuss some of the experimental needs and challenges for performing in situ nanoindentation TEM experiments on nanoparticles. In addition, we show both diffraction contrast and phase contrast in situ TEM nanoindentation experiments on silver nanoparticles with diameters below 50 nm. Evidence of the presence of dislocations was observed during deformation, but upon unloading dislocations disappeared. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1134 / 1139
页数:6
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