Quality assurance of arsenic, lead, tin and zinc in copper alloys using axial inductively coupled plasma time-of-flight mass spectrometry (ICP-TOF-MS)

被引:25
作者
Emteborg, H [1 ]
Tian, XD [1 ]
Adams, FC [1 ]
机构
[1] Univ Instelling Antwerp, Dept Chem, Micro & Trace Anal Ctr, B-2610 Wilrijk, Belgium
关键词
D O I
10.1039/a904208c
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Results for As, Pb, Sn and Zn are reported for five copper alloys. Following dissolution in a refluxing HCl-HNO3 mixture and subsequent dilution, the elements were determined by inductively coupled plasma time-of-flight mass spectrometry (ICP-TOF-MS) using In as an internal standard. The following isotopes: Zn-64, Zn-66, Zn-67, Zn-68, Zn-70, As-75, Pb-206, Pb-207 Pb-208, In-115, Sn-116, Sn-118 and Sn-120 were monitored and the intensity ratios to In-115 as an internal standard were used. The analytical results were compared with results obtained by flame atomic absorption spectrometry (FAAS) for assessment of accuracy. The results agreed fairly well, except for Zn in some compositions, which was due to background interference effects, and for Sn, where dissolution problems occurred. The relative standard deviations, % RSDs, for six replicate measurements of the elements in each copper alloy were in the range 2.0-6.1% for As, 3.8-11.0% for Pb, 1.4-9.4% for Sn and 3.6-12.9% for Zn. Uncertainty budgets for Sn and Zn associated with these determinations are described. The detection limits (3s criterion) in the solid materials with a 1.0 g sample intake and appropriate dilutions were 0.7 mu g g(-1) for Pb, 2.5 mu g g(-1) for Sn, 11 mu g g(-1) for As and 15 mu g g(-1) for Zn.
引用
收藏
页码:1567 / 1572
页数:6
相关论文
共 9 条
[1]  
[Anonymous], INDUCTIVELY COUPLED
[2]  
*EUR GUID, 1995, QUANT UNC AN MEAS
[3]   Toward the next generation of atomic mass spectrometers - Plenary lecture [J].
Hieftje, GM ;
Myers, DP ;
Li, GQ ;
Mahoney, PP ;
Burgoyne, TW ;
Ray, SJ ;
Guzowski, JP .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1997, 12 (03) :287-292
[4]  
Houk R., 1986, ANAL CHEM, V58, P97
[5]   Time-of-flight mass spectrometry for elemental analysis [J].
Mahoney, PP ;
Ray, SJ ;
Hieftje, GM .
APPLIED SPECTROSCOPY, 1997, 51 (01) :A16-A28
[6]  
Merck, 1989, MERCK IND
[7]  
MOENS L, 1995, J ANAL ATOM SPECTROM, V10, P267
[8]   Fundamental aspects of ion extraction in inductively coupled plasma mass spectrometry [J].
Niu, H ;
Houk, RS .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1996, 51 (08) :779-815
[9]   Precise measurement of isotope ratios with a double-focusing magnetic sector ICP mass spectrometer [J].
Vanhaecke, F ;
Moens, L ;
Dams, R ;
Taylor, P .
ANALYTICAL CHEMISTRY, 1996, 68 (03) :567-569