Electronic structure and transmission characteristics of SiGe nanowires

被引:8
作者
Kharche, Neerav [1 ]
Luisier, Mathieu [3 ]
Boykin, Timothy B. [4 ]
Klimeck, Gerhard [2 ]
机构
[1] Purdue Univ, Network Computat Nanotechnol, W Lafayette, IN 47906 USA
[2] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
[3] ETH, Integrated Syst Lab, CH-8092 Zurich, Switzerland
[4] Univ Alabama, Dept Elect & Comp Engn, Huntsville, AL 35899 USA
基金
美国国家科学基金会;
关键词
Nanowires; SiGe; Brillouin zone-unfolding; Open boundary conditions; NEGF;
D O I
10.1007/s10825-008-0191-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Atomistic disorder such as alloy disorder, surface roughness and inhomogeneous strain are known to influence electronic structure and charge transport. Scaling of device dimensions to the nanometer regime enhances the effects of disorder on device characteristics and the need for atomistic modeling arises. In this work SiGe alloy nanowires are studied from two different points of view: (1) Electronic structure where the bandstructure of a nanowire is obtained by projecting out small cell bands from a supercell eigen-spectrum and (2) Transport where the transmission coefficient through the nanowire is computed using an atomistic wave function approach. The nearest neighbor sp(3)d(5)s* semi-empirical tight-binding model is employed for both electronic structure and transport. The connection between dispersions and transmission coefficients of SiGe random alloy nanowires of different sizes is highlighted. Localization is observed in thin disordered wires and a transition to bulk-like behavior is observed with increasing wire diameter.
引用
收藏
页码:350 / 354
页数:5
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