Trimming phase and birefringence errors in photosensitivity-locked planar optical circuits

被引:8
作者
Chen, KP [1 ]
Herman, PR [1 ]
机构
[1] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
关键词
birefringence; optical planar waveguide components; photosensitive; polarization modes;
D O I
10.1109/68.974165
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A strong and stable photosensitivity response was permanently locked into hydrogen-loaded Mach-Zehnder planar waveguide circuits by 248-nm KrF-laser preirradiation. The photosensitivity enhancement survived thermal annealing up to 225 degreesC. Post-laser trimming at 248 nm induced an unsaturated refractive index increase of 0.002, and a birefringence change of Deltan similar to 0.0001. This combination of photosensitivity locking and post-laser tuning affords wide latitude for precise and stable tuning of waveguide phase errors and birefringence.
引用
收藏
页码:71 / 73
页数:3
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