Optical near-field microscopy of light focusing through a photonic crystal flat lens

被引：62

作者：

Fabre, Nathalie ^{[1
]}

Lalouat, Loic ^{[2
]}

Cluzel, Benoit ^{[2
]}

Melique, Xavier ^{[1
]}

Lippens, Didier ^{[1
]}

de Fornel, Frederique ^{[2
]}

Vanbesien, Olivier ^{[1
]}

机构：

[1] Univ Sci & Tech Lille Flandres Artois, IEMN, CNRS, UMR 8520, F-59652 Villeneuve Dascq, France

[2] Univ Bourgogne, CNRS, UMR 5209, ICB,Grp Opt Champ Proche, F-21078 Dijon, France

来源：

PHYSICAL REVIEW LETTERS | 2008年 / 101卷 / 07期

关键词：

D O I：

10.1103/PhysRevLett.101.073901

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report here the direct observation by using a scanning near-field microscopy technique of the light focusing through a photonic crystal flat lens designed and fabricated to operate at optical frequencies. The lens is fabricated using a III-V semiconductor slab, and we directly visualize the propagation of the electromagnetic waves by using a scanning near-field optical microscope. We directly evidence spatially, as well as spectrally, the focusing operating regime of the lens. At last, in light of the experimental scanning near-field optical microscope pictures, we discuss the lens ability to focus light at a subwavelength scale.

引用

页数：4

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