Characterization of organic thin film materials with near-field scanning optical microscopy (NSOM)

被引：51

作者：

Barbara, PF ^{[1
]}

Adams, DM ^{[1
]}

O'Connor, DB ^{[1
]}

机构：

[1] Univ Texas, Dept Chem & Biochem, Austin, TX 78712 USA

来源：

ANNUAL REVIEW OF MATERIALS SCIENCE | 1999年 / 29卷

关键词：

chemical contrast; spectroscopic imaging; polarization spectroscopy; self-assembly; energy migration;

D O I：

10.1146/annurev.matsci.29.1.433

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Recent progress on the use of near-field scanning optical microscopy (NSOM) to characterize organic thin film materials is extensively reviewed. NSOM is leading to important new information on the morphology and spatially resolved optical properties of a variety of materials, complementing more widely available methods for thin film analysis. Materials described in this review include polymer thin films, molecular aggregates, molecular crystals, molecular semiconductor hetero-junctions, biological materials, and molecular mono-, bi-, and multi-layer films.

引用

页码：433 / +

页数：49

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