High resolution in-situ imaging of reactive heterogeneous surfaces

被引:10
作者
Garfias-Mesias, LF [1 ]
Smyrl, WH [1 ]
机构
[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Corros Res Ctr, Minneapolis, MN 55455 USA
基金
美国国家科学基金会;
关键词
D O I
10.1016/S0013-4686(99)00068-7
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
A modified near-field optical microscope (NSOM) was used to locate reactive sites on polycrystalline titanium immersed in sulfuric acid. Photoelectrochemical imaging was carried out on the NSOM by using a new shear-force feedback method, PEM with simultaneous independent topography (using the tuning fork method) resolved submicron features at reactive sites at inclusions and grain boundaries; Both PEM and topographic images were obtained in-situ with high lateral resolution by using specially fabricated tips with 100 nm aperture. (C) 1999 Elsevier Science Ltd. All rights reserved.
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页码:3651 / 3657
页数:7
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