Combining a scanning near-field optical microscope with a picosecond streak camera: Statistical analysis of exciton kinetics in GaAs single-quantum wells

被引：16

作者：

Neuberth, U ^{[1
]}

Walter, L

von Freymann, G

Dal Don, B

Kalt, H

Wegener, M

Khitrova, G

Gibbs, HM

机构：

[1] Univ Karlsruhe TH, Inst Angew Phys, D-76131 Karlsruhe, Germany

[2] Univ Arizona, Ctr Opt Sci, Tucson, AZ 85721 USA

来源：

APPLIED PHYSICS LETTERS | 2002年 / 80卷 / 18期

关键词：

D O I：

10.1063/1.1477274

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Combining a low-temperature scanning near-field optical microscope with a picosecond streak camera allows us to measure the complete wavelength-time behavior at one spot on the sample within about 13 min at excitation powers of 100 nW. We use this instrument to measure the variation of relaxation times in disordered single-GaAs quantum wells with sample position. (C) 2002 American Institute of Physics.

引用

页码：3340 / 3342

页数：3

共 18 条

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