Roughening of Au(111) surfaces during ion beam erosion: A Scanning Tunneling Microscope and X-ray diffraction study

被引：2

作者：

Judy, A ^{[1
]}

Murty, MVR ^{[1
]}

Butler, E ^{[1
]}

Pomeroy, J ^{[1
]}

Cooper, BH ^{[1
]}

Woll, AR ^{[1
]}

Brock, JD ^{[1
]}

Kycia, S ^{[1
]}

Headrick, RL ^{[1
]}

机构：

[1] Cornell Univ, Atom & Solid State Phys Lab, Ithaca, NY 14853 USA

来源：

EPITAXIAL GROWTH-PRINCIPLES AND APPLICATIONS | 1999年 / 570卷

关键词：

D O I：

10.1557/PROC-570-61

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Using Scanning Tunneling Microscopy(STM) and X-ray diffraction(XRD), we have studied the development of surface roughness on Au(lll) during 500eV Ar+ ion irradiation at different angles. During normal incidence erosion the surface roughens and pattern formation occurs. The surface morphology is a mixture of mounds and pits superimposed onto a larger structure of channels and valleys. The characteristic spacing between features grows with a power law behavior t(.27), where t is the amount of time the sample was irradiated, in agreement with previous measurements[1]. At glancing angles, erosion proceeds smoothly, but not in layer-by-layer fashion. Finally, a combination of glancing angle and normal incidence erosion is used to create a rippled morphology.

引用

页码：61 / 66

页数：6

共 9 条

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