Scaling laws of the ripple morphology on Cu(110)

被引:169
作者
Rusponi, S [1 ]
Costantini, G
Boragno, C
Valbusa, U
机构
[1] Univ Genoa, INFM, Unita Ric Genova, Genoa, Italy
[2] Univ Genoa, Dipartimento Fis, CNR, Ctr Fis Superfici & Basse Temp, Genoa, Italy
关键词
D O I
10.1103/PhysRevLett.81.4184
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The evolution of the Cu(110) surface morphology during low temperature (180 K) ion sputtering was studied as a function of the incident ion beam angle theta by means of scanning tunneling microscopy. The morphology was dominated by a ripple structure with the wave vector parallel or perpendicular to the direction of the incident beam. The time evolution of the interface shows that the ripple wavelength increases in time following a scaling law lambda proportional to t(z), with z = 0.26 +/- 0.02. These results are ascribed to the effect of a Schwoebel barrier on the interlayer diffusion of the recoiling atoms produced during ion sputtering.
引用
收藏
页码:4184 / 4187
页数:4
相关论文
共 35 条
[1]   Effects of crystalline microstructure on epitaxial growth [J].
Amar, JG ;
Family, F .
PHYSICAL REVIEW B, 1996, 54 (20) :14742-14753
[2]  
Barabasi A-Ls, 1995, FRACTAL CONCEPTS SUR, DOI [10.1017/CBO9780511599798, DOI 10.1017/CBO9780511599798]
[3]   THEORY OF RIPPLE TOPOGRAPHY INDUCED BY ION-BOMBARDMENT [J].
BRADLEY, RM ;
HARPER, JME .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (04) :2390-2395
[4]   Roughening and ripple instabilities on ion-bombarded Si [J].
Carter, G ;
Vishnyakov, V .
PHYSICAL REVIEW B, 1996, 54 (24) :17647-17653
[5]   ROUGHENING INSTABILITY AND EVOLUTION OF THE GE(001) SURFACE DURING ION SPUTTERING [J].
CHASON, E ;
MAYER, TM ;
KELLERMAN, BK ;
MCILROY, DT ;
HOWARD, AJ .
PHYSICAL REVIEW LETTERS, 1994, 72 (19) :3040-3043
[6]   A new UHV variable temperature STM for gas adsorption studies [J].
Conti, R ;
Rusponi, S ;
Pagnotta, D ;
Boragno, C ;
Valbusa, U .
VACUUM, 1997, 48 (7-9) :639-641
[7]  
COSTANTINI G, IN PRESS SURF SCI
[8]   DYNAMIC SCALING OF ION-SPUTTERED SURFACES [J].
CUERNO, R ;
BARABASI, AL .
PHYSICAL REVIEW LETTERS, 1995, 74 (23) :4746-4749
[9]   STOCHASTIC-MODEL FOR SURFACE EROSION VIA ION SPUTTERING - DYNAMICAL EVOLUTION FROM RIPPLE MORPHOLOGY TO ROUGH MORPHOLOGY [J].
CUERNO, R ;
MAKSE, HA ;
TOMASSONE, S ;
HARRINGTON, ST ;
STANLEY, HE .
PHYSICAL REVIEW LETTERS, 1995, 75 (24) :4464-4467
[10]   CORRELATION FROM RANDOMNESS - QUANTITATIVE-ANALYSIS OF ION-ETCHED GRAPHITE SURFACES USING THE SCANNING TUNNELING MICROSCOPE [J].
EKLUND, EA ;
SNYDER, EJ ;
WILLIAMS, RS .
SURFACE SCIENCE, 1993, 285 (03) :157-180