Scanning tunneling microscope for magneto-optical imaging

被引：6

作者：

Prins, MWJ ^{[1
]}

Groeneveld, RHM ^{[1
]}

Abraham, DL ^{[1
]}

Schad, R ^{[1
]}

vanKempen, H ^{[1
]}

vanKesteren, HW ^{[1
]}

机构：

[1] UNIV NIJMEGEN,INST MAT RES,6525 ED NIJMEGEN,NETHERLANDS

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 02期

关键词：

D O I：

10.1116/1.588515

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Images of magnetic bits written in a Pt/Co multilayer are presented, Using photosensitive semiconducting tips in a scanning tunneling microscope the surface topography as well as the polarization-dependent optical transmission are measured. Magnetic contrast is achieved by detection of the Faraday effect. Magneto-optical lateral resolution of 250 nm is demonstrated. (C) 1996 American Vacuum Society.

引用

页码：1206 / 1209

页数：4

共 10 条

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