Thermal mapping with liquid crystal method

被引:40
作者
Csendes, A
Szekely, V
Rencz, M
机构
[1] Technical University of Budapest, Department of Electron Devices
关键词
D O I
10.1016/0167-9317(95)00350-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Good resolution thermal mapping can be achieved by using liquid crystals. The article presents a new, high resolution automated measuring equipment, which executes the measurement and the evaluation process under computer control. The equipment was developed especially for micro-thermography of integrated circuits. The paper presents the practical aspects of the liquid crystal measuring method. Resolution and accuracy features of the method are also discussed.
引用
收藏
页码:281 / 290
页数:10
相关论文
共 10 条
[1]   HIGH-RESOLUTION THERMAL MAPPING OF MICROCIRCUITS USING NEMATIC LIQUID-CRYSTALS [J].
ASZODI, G ;
SZABON, J ;
JANOSSY, I ;
SZEKELY, V .
SOLID-STATE ELECTRONICS, 1981, 24 (12) :1127-&
[2]  
BARTON DL, 1994, P 20 ISTFA, P87
[3]   LASER PROBING OF THERMAL-BEHAVIOR OF ELECTRONIC COMPONENTS AND ITS APPLICATION IN QUALITY AND RELIABILITY TESTING [J].
CLAEYS, W ;
DILHAIRE, S ;
QUINTARD, V .
MICROELECTRONIC ENGINEERING, 1994, 24 (1-4) :411-420
[4]   LIQUID CRYSTALS IN NONDESTRUCTIVE TESTING [J].
FERGASON, JL .
APPLIED OPTICS, 1968, 7 (09) :1729-&
[5]  
Gaussorgues G., 1994, INFRARED THERMOGRAPH
[6]   THERMAL RESISTANCE OF HEAT SINKS WITH TEMPERATURE-DEPENDENT CONDUCTIVITY [J].
JOYCE, WB .
SOLID-STATE ELECTRONICS, 1975, 18 (04) :321-322
[7]   SURFACE-TEMPERATURE LIMIT DETECTOR USING NEMATIC LIQUID-CRYSTALS WITH AN APPLICATION TO MICROCIRCUITS [J].
STEPHENS, CE ;
SINNADURAI, FN .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (08) :641-643
[8]  
SZEKELY V, 1988, THERMAL PROBLEMS SEM
[9]  
TRONTELJ J, 1989, ANALOG DIGITAL ASIC
[10]  
WEYL R, 1985, THERMOGRAPHIE INTEGR