Near-edge x-ray absorption fine-structure investigation of graphene

被引：194

作者：

Pacile, D. ^{[1
,2
]}

Papagno, M. ^{[1
,2
]}

Rodriguez, A. Fraile ^{[3
]}

Grioni, M. ^{[4
]}

Papagno, L. ^{[1
,2
]}

机构：

[1] Ist Nazl Fis Nucl, I-87036 Cosenza, Italy

[2] Univ Calabria, Dipartimento Fis, I-87036 Cosenza, Italy

[3] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[4] Ecole Polytech Fed Lausanne, Inst Phys Nanostruct, CH-1015 Lausanne, Switzerland

来源：

PHYSICAL REVIEW LETTERS | 2008年 / 101卷 / 06期

关键词：

D O I：

10.1103/PhysRevLett.101.066806

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO(2) substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single- layer graphene we observe a splitting of the pi* resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.

引用

页数：4

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