Space charge characterization for the 21st century

被引:74
作者
Damamme, G [1 ]
LeGressus, C [1 ]
DeReggi, AS [1 ]
机构
[1] NIST,DIV POLYMERS,GAITHERSBURG,MD 20899
关键词
D O I
10.1109/94.625645
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Various methods of characterizing insulating materials by their ability to take up charge, retain it, and release it, are reviewed critically in search of measurable quantities that could be used to predict material behavior under stress up to failure conditions. Space charge characterization data on different types of materials from polymers to inorganic single crystals and ceramics are surveyed. The charging behavior is found to be influenced by many details such as surface condition and residual stresses, The traditional approach of linking dielectric breakdown to an intrinsic critical field for the material is tested against the newly emerging view that breakdown could be linked to space charge trapping at defect sites and to the attendant energetics of the mechanically strained lattice. The characterization process thus requires more care than was previously thought necessary, but after more research should become more predictive.
引用
收藏
页码:558 / 584
页数:27
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