Effect of dislocations on thermal conductivity of GaN layers

被引:128
作者
Kotchetkov, D
Zou, J
Balandin, AA [1 ]
Florescu, DI
Pollak, FH
机构
[1] Univ Calif Riverside, Dept Elect Engn, Riverside, CA 92521 USA
[2] CUNY Brooklyn Coll, Dept Phys, Brooklyn, NY 11210 USA
[3] CUNY Brooklyn Coll, New York State Ctr Adv Technol Ultrafast Photon M, Brooklyn, NY 11210 USA
关键词
D O I
10.1063/1.1427153
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report calculation of the lattice thermal conductivity in wurtzite GaN. The proposed model is material specific and explicitly includes phonon relaxation on threading dislocations and impurities typical for GaN. We have found that a decrease of the dislocation density by two orders of magnitude in GaN leads to a corresponding increase of the thermal conductivity from 1.31 to 1.97 W/cm K. This theoretical prediction is in very good agreement with experimental data obtained from scanning thermal microscopy. The developed model can be used for thermal budget calculations in high-power density GaN devices. (C) 2001 American Institute of Physics.
引用
收藏
页码:4316 / 4318
页数:3
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