Effect of Composition of Substrate-Modifying Random Copolymers on the Orientation of Symmetric and Asymmetric Diblock Copolymer Domains

被引:232
作者
Han, Eungnak [1 ]
Stuen, Karl O. [2 ]
La, Young-Hye [2 ]
Nealey, Paul F. [2 ]
Gopalan, Padma [1 ]
机构
[1] Univ Wisconsin, Dept Mat Sci & Engn, Madison, WI 53706 USA
[2] Univ Wisconsin, Dept Biol & Chem Engn, Madison, WI 53706 USA
关键词
D O I
10.1021/ma8018393
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
The ability of random copolymer brushes and cross-linked mats to induce the vertical orientation of domains in overlying films of lamellae- and cylinder-forming block copolymers was investigated as a function of the composition. The substrate-modifying layers consisted of styrene and methyl methacrylate random copolymers and contained either a terminal hydroxyl group or a third polar comonomer of 2-hydroxyethyl methacrylate (HEMA) for grafting brushes to silicon oxide surfaces or glycidyl methacrylate (GMA) for cross-linking the random copolymer into a mat. Polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA) lamellae- and cylinder-forming block copolymers (both PS and PMMA minority block copolymers) were deposited and annealed on the modified surfaces. In all cases the vertical orientation of domains was observed for a range of random copolymer composition, but the ranges of composition were different for each combination of surface layer and block copolymer. The cylindrical domains of PS exhibited vertical structures for a very narrow range of compositions compared to cylindrical domains of PMMA or lamellae. As expected, the incorporation of polar HEMA or GMA monomers in the surface layers shifted the composition range for the perpendicular orientation of domains to higher fractions of styrene. The results are discussed in terms of the equilibration of the films in the presence of the chemically modified surfaces.
引用
收藏
页码:9090 / 9097
页数:8
相关论文
共 45 条
[1]   Facile routes to patterned surface neutralization layers for block copolymer lithography [J].
Bang, Joona ;
Bae, Joonwon ;
Lowenhielm, Peter ;
Spiessberger, Christian ;
Given-Beck, Susan A. ;
Russell, Thomas P. ;
Hawker, Craig J. .
ADVANCED MATERIALS, 2007, 19 (24) :4552-+
[2]   Defect-free nanoporous thin films from ABC triblock copolymers [J].
Bang, Joona ;
Kim, Seung Hyun ;
Drockenmuller, Eric ;
Misner, Matthew J. ;
Russell, Thomas P. ;
Hawker, Craig J. .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2006, 128 (23) :7622-7629
[3]   Development of a universal alkoxyamine for "living" free radical polymerizations [J].
Benoit, D ;
Chaplinski, V ;
Braslau, R ;
Hawker, CJ .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1999, 121 (16) :3904-3920
[4]   Polymer self-assembly as a novel extension to optical lithography [J].
Black, Charles T. .
ACS NANO, 2007, 1 (03) :147-150
[5]   Ordering cylindrical microdomains for binary blends of block copolymers with graphoepitaxy [J].
Chen, Feng ;
Akasaka, Satoshi ;
Inoue, Tornohiro ;
Takenaka, Mikihito ;
Hasegawa, Hirokazu ;
Yoshida, Hiroshi .
MACROMOLECULAR RAPID COMMUNICATIONS, 2007, 28 (22) :2137-2144
[6]  
CHEN JY, 2008, ADV MAT
[7]   Atomic force microscopy and wettability study of oxidized patterns at the surface of polystyrene [J].
Dupont-Gillain, CC ;
Nysten, B ;
Hlady, V ;
Rouxhet, PG .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1999, 220 (01) :163-169
[8]   Dimensions and shapes of block copolymer domains assembled on lithographically defined chemically patterned substrates [J].
Edwards, Erik W. ;
Mueller, Marcus ;
Stoykovich, Mark P. ;
Solak, Harun H. ;
de Pablo, Juan J. ;
Nealey, Paul F. .
MACROMOLECULES, 2007, 40 (01) :90-96
[9]   Precise control over molecular dimensions of block-copolymer domains using the interfacial energy of chemically nanopatterned substrates [J].
Edwards, EW ;
Montague, MF ;
Solak, HH ;
Hawker, CJ ;
Nealey, PF .
ADVANCED MATERIALS, 2004, 16 (15) :1315-+
[10]   Multi-armed, TEMPO-functionalized unimolecular initiators for starburst dendrimer synthesis via stable free radical polymerisation. 2. Tris (1,3,5)benzyloxy unimers [J].
Ghani, MAA ;
Abdallah, D ;
Kazmaier, PM ;
Keoshkerian, B ;
Buncel, E .
CANADIAN JOURNAL OF CHEMISTRY, 2004, 82 (09) :1403-1412