Factors affecting the height and phase images in tapping mode atomic force microscopy. Study of phase-separated polymer blends of poly(ethene-co-styrene) and poly(2,6-dimethyl-1,4-phenylene oxide)

被引:307
作者
Bar, G [1 ]
Thomann, Y [1 ]
Brandsch, R [1 ]
Cantow, HJ [1 ]
Whangbo, MH [1 ]
机构
[1] N CAROLINA STATE UNIV, DEPT CHEM, RALEIGH, NC 27695 USA
关键词
D O I
10.1021/la970091m
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Blends of two polymers, poly(ethene-co-styrene) (PES) and poly(2,6-dimethyl-1,4-phenylene oxide) (PPO), were examined with tapping mode atomic force microscopy (AFM) using various values of the driving amplitude A(0) and set-point amplitude ratio r(sp) = A(sp)/A(0), where A(sp) is the set-point amplitude. In height and phase images of PPO/PES blend samples, the relative contrast of chemically different regions depends sensitively on the r(sp) and A(0) values. As the tip-sample force is increased from small to large, both phase and height images of PPO/PES blend samples can undergo a contrast reversal twice. This makes it difficult to assign the features of height and phase images to different chemical components without performing additional experiments. Phase and height images were interpreted by analyzing several factors that affect the dependence of phase shift and amplitude damping on r(sp) and A(0).
引用
收藏
页码:3807 / 3812
页数:6
相关论文
共 40 条
  • [31] FORCES AFFECTING THE SUBSTRATE IN RESONANT TAPPING FORCE MICROSCOPY
    SPATZ, JP
    SHEIKO, S
    MOLLER, M
    WINKLER, RG
    REINEKER, P
    MARTI, O
    [J]. NANOTECHNOLOGY, 1995, 6 (02) : 40 - 44
  • [32] Surface reconstruction of the lamellar morphology in a symmetric poly(styrene-block-butadiene-block-methyl methacrylate) triblock copolymer: A tapping mode scanning force microscope study
    Stocker, W
    Beckmann, J
    Stadler, R
    Rabe, JP
    [J]. MACROMOLECULES, 1996, 29 (23) : 7502 - 7507
  • [33] Deformation, contact time, and phase contrast in tapping mode scanning force microscopy
    Tamayo, J
    Garcia, R
    [J]. LANGMUIR, 1996, 12 (18) : 4430 - 4435
  • [34] HIGH-RESOLUTION IMAGES OF CELL-SURFACE USING A TAPPING-MODE ATOMIC-FORCE MICROSCOPE
    UMEMURA, K
    ARAKAWA, H
    IKAI, A
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1993, 32 (11B): : L1711 - L1714
  • [35] Relating elastic modulus to indentation response using atomic force microscopy
    Vanlandingham, MR
    McKnight, SH
    Palmese, GR
    Eduljee, RF
    Gillespie, JW
    McCulough, RL
    [J]. JOURNAL OF MATERIALS SCIENCE LETTERS, 1997, 16 (02) : 117 - 119
  • [36] MEASURING ADHESION, ATTRACTION, AND REPULSION BETWEEN SURFACES IN LIQUIDS WITH AN ATOMIC-FORCE MICROSCOPE
    WEISENHORN, AL
    MAIVALD, P
    BUTT, HJ
    HANSMA, PK
    [J]. PHYSICAL REVIEW B, 1992, 45 (19): : 11226 - 11232
  • [37] WHANGBO MH, IN PRESS PROBE MICRO
  • [38] Imaging material properties by resonant tapping-force microscopy: A model investigation
    Winkler, RG
    Spatz, JP
    Sheiko, S
    Moller, M
    Reineker, P
    Marti, O
    [J]. PHYSICAL REVIEW B, 1996, 54 (12) : 8908 - 8912
  • [39] XU Y, IN PRESS J MACROMOL
  • [40] FRACTURED POLYMER SILICA FIBER SURFACE STUDIED BY TAPPING MODE ATOMIC-FORCE MICROSCOPY
    ZHONG, Q
    INNISS, D
    KJOLLER, K
    ELINGS, VB
    [J]. SURFACE SCIENCE, 1993, 290 (1-2) : L688 - L692