Effects of rapid thermal annealing on GaInNAs GaAs multiple quantum wells

被引:77
作者
Xin, HP [1 ]
Kavanagh, KL
Kondow, M
Tu, CW
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA
[2] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan
关键词
GaInNAs; quantum wells; GSMBE; rapid thermal annealing; photoluminescence; cross-sectional transmission electron microscopy;
D O I
10.1016/S0022-0248(98)01366-9
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Rapid thermal annealing (RTA) has been performed on GaInNAs/GaAs multiple quantum wells (QW), which were grown by GSMBE using arsine and a RF-plasma nitrogen radical beam source. RTA improves Photoluminescence (PL) intensity. The PL peak also blue-shifts at higher annealing temperatures, most likely due to Ga and In interdiffusion. The optimal annealing temperature is higher for N-containing samples than for N-free GaInAs/GaAs samples. The higher the nitrogen concentration, the larger the shift and proportionally the larger the increase in the PL intensity with RTA, indicating a higher density of non-radiative centers with N incorporation. For the sample consisting of a 2-period Ga0.7In0.3N0.02As0.98/GaAs QW and a 2-period Ga0.7In0.3As/GaAs QW, the room temperature PL intensity of N-containing QW after RTA at 750 degrees C for 10 s is comparable to that of N-free QW. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:419 / 422
页数:4
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