Near-field Raman microscopy

被引：19

作者：

Anderson, Neil ^{[1
]}

Hartschuh, Achim ^{[2
]}

Novotny, Lukas ^{[1
]}

机构：

[1] Univ Rochester, Inst Opt, Rochester, NY 14627 USA

[2] Univ Siegen, D-57068 Siegen, Germany

来源：

MATERIALS TODAY | 2005年 / 8卷 / 05期

关键词：

D O I：

10.1016/S1369-7021(05)00846-1

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Near-field microscopy offers the power of optical characterization with nanometer spatial resolution (similar to 15 nm). Combining tip-enhanced microscopy with Raman scattering spectroscopy results in the ability to localize distinct spectral features, providing a unique opportunity to characterize materials on length scales of a few nanometers using visible light.

引用

收藏

页码：50 / 54

页数：5

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