A metal insulator tunnel transistor with 16 nm channel length

被引:23
作者
Sasajima, R [1 ]
Fujimaru, K [1 ]
Matsumura, H [1 ]
机构
[1] Japan Adv Inst Sci & Technol, Sch Mat Sci, Tatsunokuchi, Ishikawa 9231292, Japan
关键词
D O I
10.1063/1.124109
中图分类号
O59 [应用物理学];
学科分类号
摘要
A nanometer transistor, metal/insulator tunnel transistor (MITT), which consists of only metal and insulator is experimentally studied. In the MITT, the Fowler-Nordheim tunneling currents through an insulator in lateral metal/insulator/metal structure are controlled by changing a voltage at a gate electrode upon the middle insulator, due to variation of tunnel-barrier thickness at the insulator. It is demonstrated that the MITT with 16 nm channel length fabricated by conventional photolithography can operate similarly to the conventional metal/oxide/semiconductor field-effect transistor with on/off ratio of current larger than 10(5). The result indicates that the MITT is a promising candidate for future switching transistors in ultralarge scale integrated circuits. (C) 1999 American Institute of Physics. [S0003-6951(99)04921-9].
引用
收藏
页码:3215 / 3217
页数:3
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