Nanometer pattern-mask fabricated by conventional photolithography

被引:12
作者
Fujimaru, K [1 ]
Ono, T [1 ]
Nagai, R [1 ]
Matsumura, H [1 ]
机构
[1] Japan Adv Inst Sci & Technol, JAIST, Sch Mat Sci, Tatsunokuchi, Ishikawa 92312, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 12B期
关键词
integrated circuit (IC); a metal/insulator tunnel transistor (MITT); anodic oxidation; metal/insulator/metal (MIM) structure; etching selectivity;
D O I
10.1143/JJAP.36.7786
中图分类号
O59 [应用物理学];
学科分类号
摘要
A novel method to fabricate a nanometer-size pattern-mask by conventional photolithography is proposed. In the method, titanium oxide (TiO2) grown laterally by anodic oxidation at the side-edge of a thin titanium (Ti) layer is utilized to fabricate nanometer-size patterns. The detailed processes and conditions for each process such as anodic oxidation are studied. It is found by scanning electron microscopy (SEM) that the nanometer-size patterns can be fabricated and the size is precisely controlled by the anodic voltage. It is also confirmed by atomic force microscopy (AFM) that a Ti pattern-mask with a slit of a few tens of nanometer width can be fabricated by the present method.
引用
收藏
页码:7786 / 7790
页数:5
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