Design and fabrication of high-performance polycrystalline silicon thin-film transistor circuits on flexible steel foils

被引:31
作者
Afentakis, T [1 ]
Hatalis, M
Voutsas, AT
Hartzell, J
机构
[1] SLA, Camas, WA 98607 USA
[2] Lehigh Univ, Dept Elect Engn, Bethlehem, PA 18015 USA
关键词
CMOS devices; CMOS digital integrated circuits; thin-film circuits; thin-film transistors (TFTs);
D O I
10.1109/TED.2006.871174
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper discusses in detail the design and fabrication process for the realization of high-performance polycrystalline silicon thin-film transistors and digital CMOS circuitry on thin flexible stainless steel foils. A comprehensive approach to substrate preparation is first presented. For transistor fabrication, distinct processing approaches are examined, such as solid-phase and excimer laser crystallization for the active semiconductor region, thermal growth and chemical vapor deposition for the gate insulator, and others. It is shown that process optimization has resulted in the fabrication of CMOS transistors with field-effect mobility values in the region of 200 cm(2)/V (.) s and I-ON/I-OFF current ratios of at least seven orders of magnitude. The design and performance of high-speed digital CMOS is addressed, and the effects of the conductive foil through parasitic capacitive coupling are examined. CMOS inverter blocks in ring oscillator circuits operating with delay times as low as 1.12 ns are reported, as well as static and dynamic shift registers operating in the megahertz regime.
引用
收藏
页码:815 / 822
页数:8
相关论文
共 24 条
[1]   High performance polysilicon circuits on thin metal foils [J].
Afentakis, T ;
Hatalis, M .
POLY-SILICON THIN FILM TRANSISTOR TECHNOLOGY AND APPLICATIONS IN DISPLAYS AND OTHER NOVEL TECHNOLOGY AREAS, 2003, 5004 :122-126
[2]  
BAKHADYRKHANOV MK, 1978, SOV PHYS SEMICOND+, V12, P398
[3]   Electrical properties of cobalt and copper contamination in processed silicon [J].
Benton, JL ;
Boone, T ;
Jacobson, DC ;
Silverman, PJ ;
Rosamilia, JM ;
Rafferty, CS ;
Weinzierl, S ;
Vu, B .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2001, 148 (06) :G326-G329
[4]   THE THIN-FILM TRANSISTOR - A LATE FLOWERING BLOOM [J].
BRODY, TP .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (11) :1614-1628
[5]  
Chen Y, 2002, INTERNATIONAL ELECTRON DEVICES 2002 MEETING, TECHNICAL DIGEST, P389, DOI 10.1109/IEDM.2002.1175860
[6]  
Fedorovich N. A., 1980, Soviet Physics - Solid State, V22, P1093
[7]   DIFFUSION OF NICKEL IN AMORPHOUS SILICON DIOXIDE AND SILICON NITRIDE FILMS [J].
GHOSHTAGORE, RN .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (11) :4374-+
[8]  
Graff K., 1999, METAL IMPURITIES SIL, V2
[9]   Poly-Si thin-film transistors on steel substrates [J].
Howell, RS ;
Stewart, M ;
Karnik, SV ;
Saha, SK ;
Hatalis, MK .
IEEE ELECTRON DEVICE LETTERS, 2000, 21 (02) :70-72
[10]  
Kato K, 1997, IEICE T ELECTRON, VE80C, P320