Polarization effects of imperfections in conducting and dielectric samples imaged with polarization-sensitive scanning near-field optical microscopy

被引：2

作者：

Eggers, G

Rosenberger, A

Held, N

Güntherodt, G

Fumagalli, P

机构：

[1] Free Univ Berlin, Inst Expt Phys, D-14195 Berlin, Germany

[2] Rhein Westfal TH Aachen, Inst Phys 2, D-52056 Aachen, Germany

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 24期

关键词：

D O I：

10.1063/1.1419039

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The influence of intrinsic birefringence and of surface imperfections on the polarization of near-field light is investigated in thin films by polarization-sensitive scanning near-field optical microscopy in transmission mode. The experimental results will be discussed and a simple simulation algorithm is proposed. (C) 2001 American Institute of Physics.

引用

收藏

页码：3929 / 3931

页数：3

相关论文

共 11 条

[1] NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM) - DEVELOPMENT AND BIOPHYSICAL APPLICATIONS [J].

BETZIG, E ;

LEWIS, A ;

HAROOTUNIAN, A ;

ISAACSON, M ;

KRATSCHMER, E .

BIOPHYSICAL JOURNAL, 1986, 49 (01) :269-279

[2] POLARIZATION CONTRAST IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].

BETZIG, E ;

TRAUTMAN, JK ;

WEINER, JS ;

HARRIS, TD ;

WOLFE, R .

APPLIED OPTICS, 1992, 31 (22) :4563-4568

[3] Scanning near-field magneto-optic microscopy using illuminated fiber tips [J].

Eggers, G ;

Rosenberger, A ;

Held, N ;

Münnemann, A ;

Güntherodt, G ;

Fumagalli, P .

ULTRAMICROSCOPY, 1998, 71 (1-4) :249-256

[4]

Eggers G, 1997, SURF INTERFACE ANAL, V25, P483, DOI 10.1002/(SICI)1096-9918(199706)25:7/8<483::AID-SIA251>3.0.CO

[5]

2-D

[6]

*FIB LTD, 1998, ADV FIBR OPT PROD CA

[7] Quantitative determination of the local Kerr rotation by scanning near-field magneto-optic microscopy [J].

Fumagalli, P ;

Rosenberger, A ;

Eggers, G ;

Munnemann, A ;

Held, N ;

Guntherodt, G .

APPLIED PHYSICS LETTERS, 1998, 72 (22) :2803-2805

[8] Non-regularly shaped plasmon resonant nanoparticle as localized light source for near-field microscopy [J].

Kottmann, JP ;

Martin, OJF ;

Smith, DR ;

Schultz, S .

JOURNAL OF MICROSCOPY, 2001, 202 :60-65

[9] Electromagnetic scattering in polarizable backgrounds [J].

Martin, OJF ;

Piller, NB .

PHYSICAL REVIEW E, 1998, 58 (03) :3909-3915

[10] Multipurpose sensor tips for scanning near-field microscopy [J].

Mihalcea, C ;

Scholz, W ;

Werner, S ;

Munster, S ;

Oesterschulze, E ;

Kassing, R .

APPLIED PHYSICS LETTERS, 1996, 68 (25) :3531-3533