Electroless nickel bumping of aluminum bondpads - Part I: Surface pretreatment and activation

被引:39
作者
Hutt, DA [1 ]
Liu, CQ
Conway, PP
Whalley, DC
Mannan, SH
机构
[1] Loughborough Univ Technol, Wolfson Sch Mech & Mfg Engn, Loughborough LE11 3TU, Leics, England
[2] Kings Coll London, Dept Engn Mech, London WC2R 2LS, England
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2002年 / 25卷 / 01期
基金
英国工程与自然科学研究理事会;
关键词
electroless nickel; flip-chip; under bump metallization (UBM); wafer bumping; zincate;
D O I
10.1109/6144.991180
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electroless nickel bumping of aluminum (Al) bond-pads followed by solder paste printing is seen as one of the lowest cost routes for the bumping of wafers prior to flip-chip assembly. However, the electroless nickel bumping of AI bondpads is not straightforward and a number of activation steps are necessary to enable the nickel deposit to form a strong, electrically conductive bond with the Al. For the electroless nickel coating of mechanical components made of aluminum, a zincate activation process has been used for many years, however extension of these techniques to semiconductor wafers requires careful control over these pretreatments to avoid damage to the very thin bondpads. is paper reports a number of experiments designed to characterize the activation of Al bondpads to electroless nickel plating, focusing on the effects of solution exposure time and bondpad composition. In addition, the results are discussed in the context of other studies presented in the literature to provide an understanding of the mechanism of the zincate activation process applied to Al bondpads.
引用
收藏
页码:87 / 97
页数:11
相关论文
共 32 条
[1]   Auger electron spectroscopy element profiles and interface with substrates of electroless deposited ternary alloys [J].
Armyanov, S ;
Steenhout, O ;
Krasteva, N ;
Georgieva, J ;
Delplancke, JL ;
Winand, R ;
Vereecken, J .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (11) :3692-3698
[2]   Solder-jetted eutectic PbSn bumps for flip-chip [J].
Baggerman, AFJ ;
Schwarzbach, D .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1998, 21 (04) :371-381
[3]  
Cai J, 2000, PROCEEDINGS OF INTERNATIONAL SYMPOSIUM ON ELECTRONIC MATERIALS AND PACKAGING, P91, DOI 10.1109/EMAP.2000.904138
[4]   Feasibility and reliability study on the electroless nickel bumping and stencil solder printing for low-cost flip chip electronic packaging [J].
Chow, YM ;
Lau, WM ;
Schetty, RE ;
Karim, ZS .
PROCEEDINGS OF INTERNATIONAL SYMPOSIUM ON ELECTRONIC MATERIALS AND PACKAGING, 2000, :79-85
[5]  
Gawrilov G.G., 1979, CHEM ELECTROLESS NIC
[6]   Ni electroless plating process for solder bump chip on glass technology [J].
Han, JI ;
Hong, SJ .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1997, 36 (4A) :2091-2095
[7]   DIRECT NICKEL-PLATING ON ALUMINUM SUBSTRATE FOR MICROBUMP FORMATION [J].
HONMA, H ;
WATANABE, H ;
KOBAYASHI, T .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (07) :1791-1795
[8]  
HUTT DA, 2002, IEEE T COMP PACKAG T, V25
[9]  
Kloeser J., 1998, IEEE Transactions on Components, Packaging & Manufacturing Technology, Part C (Manufacturing), V21, P41, DOI 10.1109/3476.670027
[10]   Stencil printing process development for low cost flip chip interconnect [J].
Li, L ;
Wiegele, S ;
Thompson, P ;
Lee, R .
48TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 1998 PROCEEDINGS, 1998, :421-426