Ways towards the scaleable integration of carbon nanotubes into silicon based technology

被引:58
作者
Duesberg, GS [1 ]
Graham, AR [1 ]
Kreupl, F [1 ]
Liebau, M [1 ]
Seidel, R [1 ]
Unger, E [1 ]
Hoenlein, W [1 ]
机构
[1] Infineon Technol AG, CPR Nano Proc, D-81739 Munich, Germany
关键词
carbon nanotubes; CVD synthesis; interconnects; vertical transistors;
D O I
10.1016/j.diamond.2003.10.021
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The outstanding performance of carbon nanotubes (CNTs) as interconnects and microelectronic devices has been shown in a number of experiments on hand-picked demonstrators. However, for implementation parallel manufacture, which involves the precise placement and the simultaneous control over the properties of millions of CNTs with microelectronic compatible processes is required. Various concepts for the large-scale integration of CNT-based electronics are compared in this presentation. One of them, catalyst mediated CVD growth, allows the direct growth of CNTs on silicon substrates. Methods for structuring the substrates and the catalyst materials on wafer scale as well as the influence of the process parameters are discussed in terms of reproducibility and uniformity. Furthermore, the synthesis of single, isolated multiwalled CNTs with lithographically defined diameters and locations has been established. This resembles the creation of vertical interconnects consisting of individual and multiple multiwalled CNTs. From this base, a concept for the assembly of CNT based, vertical, surrounding-gate transistors is presented. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:354 / 361
页数:8
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