Model for optical absorption in porous silicon

被引:26
作者
Datta, S [1 ]
Narasimhan, KL [1 ]
机构
[1] Tata Inst Fundamental Res, Solid State Elect Grp, Bombay 400005, Maharashtra, India
关键词
D O I
10.1103/PhysRevB.60.8246
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper we analyze the optical absorption in porous silicon. This is the first attempt to explicitly demonstrate that it is not possible to extract the band gap of low-dimensional nanostructures like porous silicon from a Tauc plot of root alpha (h) over bar omega vs (h) over bar omega. So we model the absorption process assuming that porous silicon is a pseudo-one-dimensional material system having a distribution of band gaps. We show that in order to explain the absorption we specifically need to invoke the following: (a) k is not conserved in optical transitions, (b) the oscillator strength of these transitions depends on the size of the nanostructure in which absorption takes place, and (c) the distribution of band gaps significantly influences the optical absorption. A natural explanation of the temperature dependence of absorption in porous silicon also follows from our model.
引用
收藏
页码:8246 / 8252
页数:7
相关论文
共 25 条
[21]   OPTICAL-ABSORPTION EVIDENCE OF A QUANTUM SIZE EFFECT IN POROUS SILICON [J].
SAGNES, I ;
HALIMAOUI, A ;
VINCENT, G ;
BADOZ, PA .
APPLIED PHYSICS LETTERS, 1993, 62 (10) :1155-1157
[22]   THEORY OF OPTICAL-PROPERTIES OF QUANTUM WIRES IN POROUS SILICON [J].
SANDERS, GD ;
CHANG, YC .
PHYSICAL REVIEW B, 1992, 45 (16) :9202-9213
[23]   COMPARISON OF QUANTUM CONFINEMENT EFFECTS ON THE ELECTRONIC ABSORPTION-SPECTRA OF DIRECT AND INDIRECT GAP SEMICONDUCTOR NANOCRYSTALS [J].
TOLBERT, SH ;
HERHOLD, AB ;
JOHNSON, CS ;
ALIVISATOS, AP .
PHYSICAL REVIEW LETTERS, 1994, 73 (24) :3266-3269
[24]   Quantum confinement in nanoscale silicon: The correlation of size with bandgap and luminescence [J].
von Behren, J ;
van Buuren, T ;
Zacharias, M ;
Chimowitz, EH ;
Fauchet, PM .
SOLID STATE COMMUNICATIONS, 1998, 105 (05) :317-322
[25]   ABSORPTION AND LUMINESCENCE STUDIES OF FREESTANDING POROUS SILICON FILMS [J].
XIE, YH ;
HYBERTSEN, MS ;
WILSON, WL ;
IPRI, SA ;
CARVER, GE ;
BROWN, WL ;
DONS, E ;
WEIR, BE ;
KORTAN, AR ;
WATSON, GP ;
LIDDLE, AJ .
PHYSICAL REVIEW B, 1994, 49 (08) :5386-5397