Comparison of magnetic images using point and thin-film magnetic force microscopy tips

被引：10

作者：

Liou, SH

机构：

[1] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA

[2] Univ Nebraska, Ctr Mat Res & Anal, Lincoln, NE 68588 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1999年 / 35卷 / 05期

关键词：

magnetic force microscopy; magnetic force microscopy tip; magnetic images of recording disks; resolution of magnetic images;

D O I：

10.1109/20.800731

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The magnetic images of a magnetic reference sample were compared using point and thin-film magnetic force microscopy (MFM) tips, The thin film MFM tip was made by magnetron sputtering of an amorphous metal. The point MFM tip was made by an ion milling process that produces a small magnetic particle on the cantilever, Our results clearly demonstrated that the volume of magnetic material involved in the tip-sample interaction is much reduced in the case of the point tip than in that of the thin film tips. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, we observed an improved resolution using a point MFM tip.

引用

页码：3989 / 3991

页数：3

共 11 条

[1]

GRUTTER P, 1990, APPL PHYS LETT, V57, P1820, DOI 10.1063/1.104030

[2]

GRUTTER P, 1991, SCANNING PROBE MICRO, V2

[3] Superparamagnetic magnetic force microscopy tips [J].