Diagnostics of surface layer disordering using optical third harmonic generation of a circular polarized light

被引：14

作者：

Yakovlev, VV

Govorkov, SV

机构：

[1] Univ Wisconsin, Dept Phys, Milwaukee, WI 53211 USA

[2] Lambda Phys Ltd, Ft Lauderdale, FL 33309 USA

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 25期

关键词：

D O I：

10.1063/1.1427425

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A nonlinear optical technique based on a third-harmonic generation of a circular polarized light is proposed for the diagnostics of order-disorder transformations in semiconductors. Applications of this technique to study both noncentrosymmetric (GaAs) and centrosymmetric (Si) materials are demonstrated. (C) 2001 American Institute of Physics.

引用

收藏

页码：4136 / 4138

页数：3

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